Grinder + CMP stress release High through put wafer handling 15umt wafer thickness in massproducing
◆ International Test Solutions
◆ ATT Systems
Probe card clean
Effective cleaning is a critical process for wafer-level-test and off-line maintenance. Optimized processes and materials maximize yields, uptimes, and probe lifetimes.
OCR WID 120
The WID 120 wafer ID reader decodes all kind of OCR, barcode, data matrix codes and QR-codes from wafer e.g. from Si, GaAs, GaN, SiC.
Cold upgrade & Chuck
Chuck: Designed for Low and High Temp applications ranging from -60C to +600C. AddON solutions for HV, HC, HF, LN etc.
Chiller: Liquid and Air cooled -40°C and -60°C solutions
Testing Solution TSK/TEL Used Prober Sales & Rental
TSK/TEL Prober Modification
Relocation/Troubleshoot
ATE/Prober Parts sales & Board repairment
◆ Htt GROUP
◆ Service
? Docking kits/Cardhoder/Inker/Hinge Sales
? Prober boards repairment:TSK/TEL
? ATE boards repairment:Advantest/Teradyne/Credence/Yokogawa/Chroma
0510-83788693
Chunhui Road #105, Xishan District, Wuxi, Jiangsu Province, China